Ceramics-Silikáty 32, (4) 289 - 303 (1988) |
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| THE EFFECT OF FIRING TEMPERATURE ON THE PROPERTIES OF MODEL THICK-FILM RESISTORS
II. Critical Coefficients of the Percolation Theory
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Kubový Alois
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Research Institute of Electrotechnical Ceramics, Pospíšilova 281, 500 64 Hradec Králové
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Conceptions of the development of structure in thick-film resistors in the course of firing [1] can be verified by measuring the dependence of the critical coefficients of the percolation theory on firing temperature. The deviations of critical coefficients from the theoretical values are theoretically explained by the assumed formation of impurity states in the glass, as a result of diffusion of Ru during the firing. The estimated activation energy of the diffusion should amount to about 1.5 eV. |
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